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Internally Threaded Studs & Full-inspection Device by Fuji Seira (Japan)
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2021-09-08
Fuji Seira successfully developed and started using a full inspection device on the "Internally Threaded Studs" used on notebooks' integrated circuits. It uses laser inspection to detect burrs and unprocessed parts, and works at a speed of 35 pieces per minute, which translates to about 5 times the speed of visual check. It makes for unmanned operation in nighttime and helps progress towards zero product defection.
The development cost JPY 7.5 million. Using laser sensors made by Keyence, the device can detect burrs that are 0.7mm long. "Internally Threaded Stud" is a product developed by Fuji Seira in response to the request for lightweighting. 72% lighter than the company's previous products, "Internally Threaded Stud" drops its cylindrical shape and changes to a triangular prismatic appearance to reduce volume, and is made of aluminum alloy instead of brass to restrain the creation of burrs from processing.
日本富士Seira
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Internally Threaded Studs & Full-inspection Device
Fuji Seira (Japan)
